Preface
xxiv Copyright © 2003-2007 ARM Limited. All rights reserved. ARM DUI 0224F
Other publications
This section lists relevant documents published by third parties:
The following publication describes the JTAG ports with which Multi-ICE or RealView
ICE communicates:
• IEEE Standard Test Access Port and Boundary Scan Architecture (IEEE Std.
1149.1).
The following datasheets describe some of the integrated circuits or modules used on
the PB926EJ-S:
• CODEC with Sample Rate Conversion and 3D Sound (LM4549) National
Semiconductor, Santa Clara, CA.
• Mobile DiskOnChip Plus 32/64MByte, M-Systems Inc., Newark, CA.
• MultiMedia Card Product Manual SanDisk, Sunnyvale, CA.
• Serially Programmable Clock Source (ICS307), ICS, San Jose, CA.
• Serial Microwire Bus EEPROM (M93LC46) STMicroelectronics, Amsterdam,
The Netherlands.
• 1.8 Volt Intel StrataFlash
®
Wireless Memory with 3.0 Volt I/O Intel Corporation,
Santa Clara, CA. See the Build of Materials (BOM) file for the part number of the
flash device.
• TFT-LCD Module (LQ084V1DG21) Sharp Corporation, Osaka, Japan.
• Three-In-One Fast Ethernet Controller (LAN91C111) SMSC, Hauppauge, NY.
• Touch Screen Controller (TCS2200) Texas Instruments, Dallas, TX.
