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204 Chapter 10
Scan test
Running est from command line
Table 78 AC Connectivity test options
Bypass test
The Bypass test format is:
b
The Bypass test places the scan ring hardware into bypass mode.
DC Connectivity test
DC Connectivity test format is:
d [-s -p #]
Table 79 shows the options for the this test.
Table 79 Dc Connectivity test options
Gate Array test
The Gate Array test format is:
g [options] [pattern file]
Table 80 shows the options for the this test.
Option Description
-s Step mode (for debug purposes).
-p <number> Run pattern number only.
Option Description
-s Step mode (for debug purposes).
-p <number> Run pattern number only.